Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Wei Wei, Emiliano Pallecchi, Henri Happy, David Jiménez. Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs. Microelectronics Journal, 133:105715, March 2023. [doi]

@article{MavredakisPWPHJ23,
  title = {Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs},
  author = {Nikolaos Mavredakis and Anibal Pacheco-Sanchez and Wei Wei and Emiliano Pallecchi and Henri Happy and David Jiménez},
  year = {2023},
  month = {March},
  doi = {10.1016/j.mejo.2023.105715},
  url = {https://doi.org/10.1016/j.mejo.2023.105715},
  researchr = {https://researchr.org/publication/MavredakisPWPHJ23},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {133},
  pages = {105715},
}