Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Wei Wei, Emiliano Pallecchi, Henri Happy, David Jiménez. Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs. Microelectronics Journal, 133:105715, March 2023. [doi]

Abstract

Abstract is missing.