Improving reliability for bit parallel finite field multipliers using Decimal Hamming

Nikolaos Mavrogiannakis, Costas Argyrides, Dhiraj K. Pradhan. Improving reliability for bit parallel finite field multipliers using Decimal Hamming. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 69-72, IEEE, 2010. [doi]

Abstract

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