Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown. I::DDQ:: and AC Scan: The War Against Unmodelled Defects. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 250-258, IEEE Computer Society, 1996.
@inproceedings{MaxwellAKB96,
title = {I::DDQ:: and AC Scan: The War Against Unmodelled Defects},
author = {Peter C. Maxwell and Robert C. Aitken and Kathleen R. Kollitz and Allen C. Brown},
year = {1996},
tags = {C++},
researchr = {https://researchr.org/publication/MaxwellAKB96},
cites = {0},
citedby = {0},
pages = {250-258},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}