Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown. I::DDQ:: and AC Scan: The War Against Unmodelled Defects. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 250-258, IEEE Computer Society, 1996.
Abstract is missing.