Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes

Mahta Mayahinia, Hsiao-Hsuan Liu, Subrat Mishra, Zsolt Tokei, Francky Catthoor, Mehdi B. Tahoori. Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-6, IEEE, 2023. [doi]

@inproceedings{MayahiniaLMTCT23,
  title = {Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes},
  author = {Mahta Mayahinia and Hsiao-Hsuan Liu and Subrat Mishra and Zsolt Tokei and Francky Catthoor and Mehdi B. Tahoori},
  year = {2023},
  doi = {10.23919/DATE56975.2023.10137008},
  url = {https://doi.org/10.23919/DATE56975.2023.10137008},
  researchr = {https://researchr.org/publication/MayahiniaLMTCT23},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023},
  publisher = {IEEE},
  isbn = {978-3-9819263-7-8},
}