Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes

Mahta Mayahinia, Hsiao-Hsuan Liu, Subrat Mishra, Zsolt Tokei, Francky Catthoor, Mehdi B. Tahoori. Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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