An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories - researchr publication authors

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Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan. An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 650-655, IEEE, 2022. [doi]

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