Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan. An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 650-655, IEEE, 2022. [doi]
@inproceedings{MayahiniaTHTA22,
title = {An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories},
author = {Mahta Mayahinia and Mehdi B. Tahoori and Gurgen Harutyunyan and Grigor Tshagharyan and Karen Amirkhanyan},
year = {2022},
doi = {10.1109/ITC50671.2022.00091},
url = {https://doi.org/10.1109/ITC50671.2022.00091},
researchr = {https://researchr.org/publication/MayahiniaTHTA22},
cites = {0},
citedby = {0},
pages = {650-655},
booktitle = {IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6270-9},
}