John Mayega, Okan Erdogan, Paul M. Belemjian, Kuan Zhou, John F. McDonald, Russell P. Kraft. 3D direct vertical interconnect microprocessors test vehicle. In Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, Washington, DC, USA, April 28-29, 2003. pages 141-146, ACM, 2003. [doi]
@inproceedings{MayegaEBZMK03,
title = {3D direct vertical interconnect microprocessors test vehicle},
author = {John Mayega and Okan Erdogan and Paul M. Belemjian and Kuan Zhou and John F. McDonald and Russell P. Kraft},
year = {2003},
doi = {10.1145/764808.764846},
url = {http://doi.acm.org/10.1145/764808.764846},
tags = {testing},
researchr = {https://researchr.org/publication/MayegaEBZMK03},
cites = {0},
citedby = {0},
pages = {141-146},
booktitle = {Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, Washington, DC, USA, April 28-29, 2003},
publisher = {ACM},
isbn = {1-58113-677-3},
}