Franziska Mayer, Christian Schott, Enrico Billich, Saeid Yazdani, Ulrich Heinkel, Georg Daler, Bernhard Ruf, Ricardo Pannuzzo, Wolfgang Dickenscheid. Automatic Verification of Mixed-Signal ATE Test Programs using Device Variation. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 374-379, IEEE, 2021. [doi]
Abstract is missing.