Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation

Colin C. McAndrew, Mariam Hoseini, Brandt Braswell, Doug Garrity. Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(7):2252-2263, July 2023. [doi]

@article{McAndrewHBG23,
  title = {Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation},
  author = {Colin C. McAndrew and Mariam Hoseini and Brandt Braswell and Doug Garrity},
  year = {2023},
  month = {July},
  doi = {10.1109/TCAD.2022.3216550},
  url = {https://doi.org/10.1109/TCAD.2022.3216550},
  researchr = {https://researchr.org/publication/McAndrewHBG23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {42},
  number = {7},
  pages = {2252-2263},
}