Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation

Colin C. McAndrew, Mariam Hoseini, Brandt Braswell, Doug Garrity. Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(7):2252-2263, July 2023. [doi]

Abstract

Abstract is missing.