Globally Reliable Variation-Aware Sizing of Analog Integrated Circuits via Response Surfaces and Structural Homotopy - researchr publication

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Trent McConaghy, Georges G. E. Gielen. Globally Reliable Variation-Aware Sizing of Analog Integrated Circuits via Response Surfaces and Structural Homotopy. IEEE Trans. on CAD of Integrated Circuits and Systems, 28(11):1627-1640, 2009. [doi]

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