Jeanne Trinko Mechler, Raymond J. Bulaga, Jon Garlett. In-system failure investigation on 0.18 μm high speed serial link ASIC using logic built-in self test. In Proceedings of the IEEE Custom Integrated Circuits Conference, CICC 2003, San Jose, CA, USA, September 21 - 24, 2003. pages 613-616, IEEE, 2003. [doi]
Abstract is missing.