G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen. Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. In 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.