G. Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas. Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 487-492, IEEE Computer Society, 2016. [doi]
Abstract is missing.