Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products

M. Yazdan Mehr, M. R. Toroghinejad, F. Karimzadeh, W. D. van Driel, G. Q. Zhang. Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products. Microelectronics Reliability, 78:143-147, 2017. [doi]

Authors

M. Yazdan Mehr

This author has not been identified. Look up 'M. Yazdan Mehr' in Google

M. R. Toroghinejad

This author has not been identified. Look up 'M. R. Toroghinejad' in Google

F. Karimzadeh

This author has not been identified. Look up 'F. Karimzadeh' in Google

W. D. van Driel

This author has not been identified. Look up 'W. D. van Driel' in Google

G. Q. Zhang

This author has not been identified. Look up 'G. Q. Zhang' in Google