Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products

M. Yazdan Mehr, M. R. Toroghinejad, F. Karimzadeh, W. D. van Driel, G. Q. Zhang. Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products. Microelectronics Reliability, 78:143-147, 2017. [doi]

Abstract

Abstract is missing.