M. Yazdan Mehr, M. R. Toroghinejad, F. Karimzadeh, W. D. van Driel, G. Q. Zhang. Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products. Microelectronics Reliability, 78:143-147, 2017. [doi]
@article{MehrTKDZ17,
title = {Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products},
author = {M. Yazdan Mehr and M. R. Toroghinejad and F. Karimzadeh and W. D. van Driel and G. Q. Zhang},
year = {2017},
doi = {10.1016/j.microrel.2017.08.014},
url = {https://doi.org/10.1016/j.microrel.2017.08.014},
researchr = {https://researchr.org/publication/MehrTKDZ17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {78},
pages = {143-147},
}