Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kypros Constantinides, Valeria Bertacco, Todd M. Austin. Low-cost protection for SER upsets and silicon defects. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1146-1151, ACM, 2007.
Abstract is missing.