Delay Fault Diagnosis for Non-Robust Test

Vishal J. Mehta, Malgorzata Marek-Sadowska, Zhiyuan Wang, Kun-Han Tsai, Janusz Rajski. Delay Fault Diagnosis for Non-Robust Test. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 463-472, IEEE Computer Society, 2006. [doi]

Authors

Vishal J. Mehta

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Malgorzata Marek-Sadowska

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Zhiyuan Wang

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Kun-Han Tsai

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Janusz Rajski

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