R. Mehtani, B. Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra. Mix Test: A Mixed-Signal Extension to a Digital Test System. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 945-953, IEEE Computer Society, 1993.
Abstract is missing.