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Improving Total IC Design Quality Using Application Mode Testing

R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker. Improving Total IC Design Quality Using Application Mode Testing. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 866-872, IEEE Computer Society, 1992.

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