Multiple-objective backtrace for solving test generation constraints

Andrei Mekler, Jaan Raik. Multiple-objective backtrace for solving test generation constraints. In Proceedings of the 2003 International Symposium on System-on-Chip, Tampere, Finland, November 19-21, 2003. pages 123-126, IEEE, 2003. [doi]

Authors

Andrei Mekler

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Jaan Raik

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