Andrei Mekler, Jaan Raik. Multiple-objective backtrace for solving test generation constraints. In Proceedings of the 2003 International Symposium on System-on-Chip, Tampere, Finland, November 19-21, 2003. pages 123-126, IEEE, 2003. [doi]
@inproceedings{MeklerR03,
title = {Multiple-objective backtrace for solving test generation constraints},
author = {Andrei Mekler and Jaan Raik},
year = {2003},
doi = {10.1109/ISSOC.2003.1267732},
url = {https://doi.org/10.1109/ISSOC.2003.1267732},
researchr = {https://researchr.org/publication/MeklerR03},
cites = {0},
citedby = {0},
pages = {123-126},
booktitle = {Proceedings of the 2003 International Symposium on System-on-Chip, Tampere, Finland, November 19-21, 2003},
publisher = {IEEE},
isbn = {0-7803-8160-2},
}