Automatic Location of IC Design Errors Using Beam System - researchr publication authors

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M. Melgara, M. Battu, P. Garino, J. Dowe, Y. J. Vernay, M. Marzouki, F. Boland. Automatic Location of IC Design Errors Using Beam System. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 898-907, IEEE Computer Society, 1988.

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