M. Melgara, M. Battu, P. Garino, J. Dowe, Y. J. Vernay, M. Marzouki, F. Boland. Automatic Location of IC Design Errors Using Beam System. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 898-907, IEEE Computer Society, 1988.
@inproceedings{MelgaraBGDVMB88,
title = {Automatic Location of IC Design Errors Using Beam System},
author = {M. Melgara and M. Battu and P. Garino and J. Dowe and Y. J. Vernay and M. Marzouki and F. Boland},
year = {1988},
tags = {design},
researchr = {https://researchr.org/publication/MelgaraBGDVMB88},
cites = {0},
citedby = {0},
pages = {898-907},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988},
publisher = {IEEE Computer Society},
}