Rafael Mendonça, Sidney Lins, Gabriela Veroneze, Marcelo Oliveira, Renan Medeiros, Vicente F. Lucena. Construction of a Digital Twin for Reliability Analysis: A Case Study of a Storage Process. In 27th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2022, Stuttgart, Germany, September 6-9, 2022. pages 1-4, IEEE, 2022. [doi]
Abstract is missing.