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Reliability evaluation for Blu-Ray laser diodes

Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso. Reliability evaluation for Blu-Ray laser diodes. Microelectronics Reliability, 50(4):467-470, 2010. [doi]

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Matteo Meneghini

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Nicola Trivellin

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Kenji Orita

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Masaaki Yuri

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Tsuyoshi Tanaka

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Daisuke Ueda

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Enrico Zanoni

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Gaudenzio Meneghesso

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