Reliability evaluation for Blu-Ray laser diodes

Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso. Reliability evaluation for Blu-Ray laser diodes. Microelectronics Reliability, 50(4):467-470, 2010. [doi]

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