Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso. Reliability evaluation for Blu-Ray laser diodes. Microelectronics Reliability, 50(4):467-470, 2010. [doi]
@article{MeneghiniTOYTUZM10,
title = {Reliability evaluation for Blu-Ray laser diodes},
author = {Matteo Meneghini and Nicola Trivellin and Kenji Orita and Masaaki Yuri and Tsuyoshi Tanaka and Daisuke Ueda and Enrico Zanoni and Gaudenzio Meneghesso},
year = {2010},
doi = {10.1016/j.microrel.2010.01.034},
url = {http://dx.doi.org/10.1016/j.microrel.2010.01.034},
tags = {reliability},
researchr = {https://researchr.org/publication/MeneghiniTOYTUZM10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {4},
pages = {467-470},
}