Optimization of 1.8V I/O circuits for performance, reliability at the 100nm technology node

Vinod Menezes, C. B. Keshav, Sushil Gupta, M. Roopashree, S. Krishnan, A. Amerasekera, G. Palau. Optimization of 1.8V I/O circuits for performance, reliability at the 100nm technology node. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 122-127, IEEE Computer Society, 2003. [doi]

@inproceedings{MenezesKGRKAP03,
  title = {Optimization of 1.8V I/O circuits for performance, reliability at the 100nm technology node},
  author = {Vinod Menezes and C. B. Keshav and Sushil Gupta and M. Roopashree and S. Krishnan and A. Amerasekera and G. Palau},
  year = {2003},
  url = {http://csdl.computer.org/comp/proceedings/vlsid/2003/1868/00/18680122abs.htm},
  tags = {optimization, C++, reliability},
  researchr = {https://researchr.org/publication/MenezesKGRKAP03},
  cites = {0},
  citedby = {0},
  pages = {122-127},
  booktitle = {16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-1868-0},
}