Chang Meng, Hanyu Wang, Yuqi Mai, Weikang Qian, Giovanni De Micheli. VACSEM: Verifying Average Errors in Approximate Circuits Using Simulation-Enhanced Model Counting. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2024, Valencia, Spain, March 25-27, 2024. pages 1-6, IEEE, 2024. [doi]
Abstract is missing.