Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. Input pattern classification for transistor level testing of BiCMOS circuits. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 457-462, IEEE Computer Society, 1994. [doi]
@inproceedings{MenonJM94,
title = {Input pattern classification for transistor level testing of BiCMOS circuits},
author = {Sankaran M. Menon and Anura P. Jayasumana and Yashwant K. Malaiya},
year = {1994},
doi = {10.1109/VTEST.1994.292273},
url = {http://dx.doi.org/10.1109/VTEST.1994.292273},
researchr = {https://researchr.org/publication/MenonJM94},
cites = {0},
citedby = {0},
pages = {457-462},
booktitle = {12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-5440-6},
}