Sankaran M. Menon - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 17 from 17

2022

Special Session: Closed Chassis Platform Debug of Compute Systems using the Functional Ubiquitous USB Type-C ReceptacleSankaran M. Menon, Rolf Kühnis. vts 2021: 1-4 [doi]

2019

Techniques for Debug of Low Power SoCsSankaran M. Menon, Ashish Gupta, Chinna Prudvi, Rolf Kühnis, Sukhbinder Singh Takhar, Spencer K. Millican, Eric Rentschler, Pandy Kalimuthu, Preeti Ranjan Panda, Priyadarsan Patra. mtv 2019: 45-49 [doi]

1997

Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS CircuitsSankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. vlsid 1997: 545-546 [doi]

Operational and Test Performance in the Presence of Built-in Current SensorsSankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong. vlsi, 5(3):285-298, 1997. [doi]

1996

Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS CircuitsSankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. glvlsi 1996: 214-219 [doi]

Fault Modeling of ECL for High Fault Coverage of Physical DefectsSankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. vlsi, 4(3):231-242, 1996. [doi]

1995

A Novel High-Speed BiCMOS Domino Logic FamilyAnura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon. iscas 1995: 21-24

Testable design of BiCMOS circuits for stuck-open fault detection using single patternsSankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman. jssc, 30(8):855-863, August 1995. [doi]

1994

DDQ Testing for Large ICsYashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon. vlsi, 1(4):277-284, 1994. [doi]

Input pattern classification for transistor level testing of BiCMOS circuitsSankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. vts 1994: 457-462 [doi]

The Effect of Built-In Current Sensors (BICS) on Operational and Test PerformanceSankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong. vlsid 1994: 187-190

1993

Test Generation for BiCMOS CircuitsSankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. iscas 1993: 1987-1990

Testable design for BiCMOS stuck-open fault detectionSankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. vts 1993: 296-302 [doi]

1992

On Bridging Faults in ECL CircuitsSankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. vlsid 1992: 55-60 [doi]

Behavior of faulty single BJT BiCMOS logic gatesSankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. vts 1992: 315-320 [doi]

1991

Enhancement of resolution in supply current based testing for large ICsYashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon. vts 1991: 291-296 [doi]

Gate level representation of ECL circuits for fault modelingSankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. glvlsi 1991: 330-331 [doi]

Sign in or sign up to see more results.

runs on WebDSL