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Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. Behavior of faulty single BJT BiCMOS logic gates. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 315-320, IEEE, 1992. [doi]
Abstract is missing.