Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. Behavior of faulty single BJT BiCMOS logic gates. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 315-320, IEEE, 1992. [doi]
@inproceedings{MenonMJ92,
title = {Behavior of faulty single BJT BiCMOS logic gates},
author = {Sankaran M. Menon and Yashwant K. Malaiya and Anura P. Jayasumana},
year = {1992},
doi = {10.1109/VTEST.1992.232772},
url = {http://dx.doi.org/10.1109/VTEST.1992.232772},
researchr = {https://researchr.org/publication/MenonMJ92},
cites = {0},
citedby = {0},
pages = {315-320},
booktitle = {10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA},
publisher = {IEEE},
isbn = {0-7803-0623-6},
}