Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. In 6th Great Lakes Symposium on VLSI (GLS-VLSI 96), March 22-23, 1996, Ames, IA, USA. pages 214-219, IEEE Computer Society, 1996. [doi]
Abstract is missing.