Testable design of BiCMOS circuits for stuck-open fault detection using single patterns

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman. Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. J. Solid-State Circuits, 30(8):855-863, August 1995. [doi]

Abstract

Abstract is missing.