Testable design of BiCMOS circuits for stuck-open fault detection using single patterns

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman. Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. J. Solid-State Circuits, 30(8):855-863, August 1995. [doi]

Authors

Sankaran M. Menon

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Yashwant K. Malaiya

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Anura P. Jayasumana

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Rochit Rajsuman

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