Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman. Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. J. Solid-State Circuits, 30(8):855-863, August 1995. [doi]
@article{MenonMJR95,
title = {Testable design of BiCMOS circuits for stuck-open fault detection using single patterns},
author = {Sankaran M. Menon and Yashwant K. Malaiya and Anura P. Jayasumana and Rochit Rajsuman},
year = {1995},
month = {August},
doi = {10.1109/4.400427},
url = {https://doi.org/10.1109/4.400427},
researchr = {https://researchr.org/publication/MenonMJR95},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {30},
number = {8},
pages = {855-863},
}