Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS Circuits - researchr publication

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Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS Circuits. In 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India. pages 545-546, IEEE Computer Society, 1997. [doi]

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