Fault Modeling of ECL for High Fault Coverage of Physical Defects

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design, 4(3):231-242, 1996. [doi]

Authors

Sankaran M. Menon

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Yashwant K. Malaiya

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Anura P. Jayasumana

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