Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana. Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design, 4(3):231-242, 1996. [doi]
@article{MenonMJ96,
title = {Fault Modeling of ECL for High Fault Coverage of Physical Defects},
author = {Sankaran M. Menon and Yashwant K. Malaiya and Anura P. Jayasumana},
year = {1996},
doi = {10.1155/1996/80472},
url = {https://doi.org/10.1155/1996/80472},
researchr = {https://researchr.org/publication/MenonMJ96},
cites = {0},
citedby = {0},
journal = {VLSI Design},
volume = {4},
number = {3},
pages = {231-242},
}