Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ. ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 1194-1197, IEEE, 2005. [doi]
Abstract is missing.