Michael Merrett, Yangang Wang, Mark Zwolinski, Koushik Maharatna, Massimo Alioto. Design metrics for RTL level estimation of delay variability due to intradie (random) variations. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 2498-2501, IEEE, 2010. [doi]
Abstract is missing.