New opportunities with the open architecture test system

Adi Merschon. New opportunities with the open architecture test system. In Masaharu Imai, editor, Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004. pages 341, IEEE, 2004. [doi]

Abstract

Abstract is missing.