Behzad Mesgarzadeh, Ingemar Söderquist Saab, Atila Alvandpour. Reliability challenges in avionics due to silicon aging. In Jaan Raik, Viera Stopjaková, Heinrich Theodor Vierhaus, Witold A. Pleskacz, Raimund Ubar, Helena Kruus, Maksim Jenihhin, editors, IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012. pages 342-347, IEEE, 2012. [doi]
@inproceedings{MesgarzadehSA12,
title = {Reliability challenges in avionics due to silicon aging},
author = {Behzad Mesgarzadeh and Ingemar Söderquist Saab and Atila Alvandpour},
year = {2012},
doi = {10.1109/DDECS.2012.6219085},
url = {http://dx.doi.org/10.1109/DDECS.2012.6219085},
researchr = {https://researchr.org/publication/MesgarzadehSA12},
cites = {0},
citedby = {0},
pages = {342-347},
booktitle = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012},
editor = {Jaan Raik and Viera Stopjaková and Heinrich Theodor Vierhaus and Witold A. Pleskacz and Raimund Ubar and Helena Kruus and Maksim Jenihhin},
publisher = {IEEE},
isbn = {978-1-4673-1187-8},
}