Behzad Mesgarzadeh, Ingemar Söderquist Saab, Atila Alvandpour. Reliability challenges in avionics due to silicon aging. In Jaan Raik, Viera Stopjaková, Heinrich Theodor Vierhaus, Witold A. Pleskacz, Raimund Ubar, Helena Kruus, Maksim Jenihhin, editors, IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012. pages 342-347, IEEE, 2012. [doi]
Abstract is missing.